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🚧 This document is still being actively worked on and is subject to change. 🚧
| Authors |
|
| Responsible |
|
| Last Updated | 10/12/2025, 12:48:54 PM |
| Last Author | Kai Berszin |
Low-Level Sine Sweep
| Subject | Description |
|---|---|
| Testing Model | Performed on fully assembled CubeSat |
| Product Description | Low-level sine vibration |
| Test Reason | Check for changes |
- Issue date: <Insert Date>
- Approved by: <Insert Name>
- Responsible Test Engineer: <Insert Name>
Low-Level Sine Sweep
Testing Equipment​
- Shakertable
- Structural Sensors (defined in Overview Strucutral Testing)
- EQM Adapter and EQM Model
- Locktie for the screws
Test Method​
- Performed after every major test (not after changing the axis). If we find out that there was a change, we will conduct the tests inbetween but with a sine-sweep after every test (inbetween changes of axis)
- Frequency-range: 20-500 Hz
- Sweep rate:2 oct/min
- Amplitude: 0.25 peak acceleration (Todo: Find out peak acceleration for each axis)
- Performed on each of the axis
- Duration: 1h
Check Condition and Requirements​
- Derive the data according to the procedure in Instar Manual -> Half-Power Method
- Overlay the two plots and check if there is a shift by more than 5 percentage or an amplitude shift by more than 5 percent. (100 percent = value of the sine-sweep before the test)
Test Results​
<Describe the results of the test in a short fasion>
Test Judgement​
- Overlay the two plots for each sensor and check if there is a shift by more than 5 percentage or an amplitude shift by more than 5 percent. (100 percent = value of the sine-sweep before the test)
Appendix​
Photo of testing​
<Insert picture of the exact testing configuration>
Testing data​
<Insert a table or diagram of the exact output of the test (without intepretation)>